Introduction to Focused Ion Beams: Instrumentation, Theory, Techniques and Practice
US$44.20
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US$44.20
Price when purchased online
Free shipping
Free 30-day returns
Sold and shipped by dieeventscheune.de
Free 30-day returns Details
Product details
| Management number | 233379404 | Release Date | 2026/06/27 | List Price | US$44.20 | Model Number | 233379404 | ||
|---|---|---|---|---|---|---|---|---|---|
| Category | |||||||||
Introduction to Focused Ion Beams is geared towards techniques and applications. This is the only text that discusses and presents the theory directly related to applications and the only one that discusses the vast applications and techniques used in FIBs and dual platform instruments. Read more
| ASIN | B000QF5E5K |
|---|---|
| XRay | Not Enabled |
| ISBN13 | 978-0387233130 |
| Edition | 2005th |
| Language | English |
| File size | 7.3 MB |
| Page Flip | Not Enabled |
| Publisher | Springer |
| Word Wise | Enabled |
| Print length | 374 pages |
| Accessibility | Learn more |
| Publication date | May 18, 2006 |
| Enhanced typesetting | Not Enabled |
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